The Mean Residual Life Function of a K-Out Structure at the System Level

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Date

2006

Authors

Bayramoglu I.

Journal Title

Journal ISSN

Volume Title

Publisher

IEEE-Inst Electrical Electronics Engineers Inc

Open Access Color

Green Open Access

No

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Top 10%
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Top 1%
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Top 10%

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Abstract

In the study of the reliability of technical systems, k-out-of-n systems play an important role. In the present paper, We consider a k-out-of-n system consisting of n identical components with independent lifetimes having a common distribution function F. Under the condition that, at time t, all the components of the system are working, we propose a new definition for the mean residual life (MRL) function of the system, and obtain several properties of that system.

Description

Keywords

characterization, generalized Pareto distributions, increasing failure rate distributions, mean residual lifetime, order statistics, parallel systems, Aging Properties, Order-Statistics, Distributions

Fields of Science

0211 other engineering and technologies, 02 engineering and technology, 0101 mathematics, 01 natural sciences

Citation

WoS Q

Q1

Scopus Q

Q1
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OpenCitations Citation Count
130

Source

Ieee Transactıons on Relıabılıty

Volume

55

Issue

2

Start Page

314

End Page

318
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Citations

CrossRef : 109

Scopus : 151

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Mendeley Readers : 13

SCOPUS™ Citations

151

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Web of Science™ Citations

134

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Page Views

3

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Downloads

9

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