The Mean Residual Life Function of a K-Out Structure at the System Level
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Date
2006
Authors
Bayramoglu I.
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE-Inst Electrical Electronics Engineers Inc
Open Access Color
Green Open Access
No
OpenAIRE Downloads
OpenAIRE Views
Publicly Funded
No
Abstract
In the study of the reliability of technical systems, k-out-of-n systems play an important role. In the present paper, We consider a k-out-of-n system consisting of n identical components with independent lifetimes having a common distribution function F. Under the condition that, at time t, all the components of the system are working, we propose a new definition for the mean residual life (MRL) function of the system, and obtain several properties of that system.
Description
ORCID
Keywords
characterization, generalized Pareto distributions, increasing failure rate distributions, mean residual lifetime, order statistics, parallel systems, Aging Properties, Order-Statistics, Distributions
Fields of Science
0211 other engineering and technologies, 02 engineering and technology, 0101 mathematics, 01 natural sciences
Citation
WoS Q
Q1
Scopus Q
Q1

OpenCitations Citation Count
130
Source
Ieee Transactıons on Relıabılıty
Volume
55
Issue
2
Start Page
314
End Page
318
PlumX Metrics
Citations
CrossRef : 109
Scopus : 151
Captures
Mendeley Readers : 13
SCOPUS™ Citations
151
checked on Mar 22, 2026
Web of Science™ Citations
134
checked on Mar 22, 2026
Page Views
3
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Downloads
9
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