Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14365/3640
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DC Field | Value | Language |
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dc.contributor.author | Degirmenci M. | - |
dc.contributor.author | Akan A. | - |
dc.date.accessioned | 2023-06-16T15:01:51Z | - |
dc.date.available | 2023-06-16T15:01:51Z | - |
dc.date.issued | 2020 | - |
dc.identifier.isbn | 9.78173E+12 | - |
dc.identifier.uri | https://doi.org/10.1109/TIPTEKNO50054.2020.9299262 | - |
dc.identifier.uri | https://hdl.handle.net/20.500.14365/3640 | - |
dc.description | 2020 Medical Technologies Congress, TIPTEKNO 2020 -- 19 November 2020 through 20 November 2020 -- 166140 | en_US |
dc.description.abstract | Epilepsy is a type of neurological disorder that causes abnormal brain activities and creates epileptic seizures. Traditionally epileptic seizure prediction is realized with a visual examination of Electroencephalogram (EEG) signals. But this technique needs a long time EEG monitoring. So, the automatic epileptic seizures prediction schemes become a requirement at this point. This study proposes a method to classify epileptic seizures and normal EEG data by utilizing the Intrinsic Time-scale Decomposition (ITD)-based features. The dataset has been supplied from the database of the Epileptology Department of Bonn University. It contains 5 data groups A, B, C, D, E. The study aims to classify healthy and epileptic data, so data of groups A and E are used to perform evaluations of proposed methods. The EEG data are decomposed into Proper Rotation Components (PRCs) by ITD. The feature extraction methods are applied to the first five PRCs of each EEG data from healthy and epileptic individuals. These features are classified using K-Nearest Neighbors (KNN), Linear Discriminant Analysis (LDA), Naive Bayes, Support Vector Machine (SVM) and Logistic Regression classifiers. The results demonstrated that the epileptic data is differentiated from normal data by applying the nonlinear ITD with outstanding classification performance. © 2020 IEEE. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
dc.relation.ispartof | TIPTEKNO 2020 - Tip Teknolojileri Kongresi - 2020 Medical Technologies Congress, TIPTEKNO 2020 | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | EEG | en_US |
dc.subject | Electroencephalogram | en_US |
dc.subject | Epileptic Seizures | en_US |
dc.subject | Intrinsic Time-Scale Decomposition | en_US |
dc.subject | Biomedical engineering | en_US |
dc.subject | Brain | en_US |
dc.subject | Discriminant analysis | en_US |
dc.subject | Logistic regression | en_US |
dc.subject | Nearest neighbor search | en_US |
dc.subject | Neurophysiology | en_US |
dc.subject | Support vector machines | en_US |
dc.subject | Support vector regression | en_US |
dc.subject | Classification performance | en_US |
dc.subject | Electroencephalogram signals | en_US |
dc.subject | Epileptic seizure prediction | en_US |
dc.subject | Feature extraction methods | en_US |
dc.subject | Intrinsic time-scale decompositions | en_US |
dc.subject | K nearest neighbor (KNN) | en_US |
dc.subject | Linear discriminant analysis | en_US |
dc.subject | Logistic regression classifier | en_US |
dc.subject | Electroencephalography | en_US |
dc.title | EEG based Epileptic Seizures Detection using Intrinsic Time-Scale Decomposition | en_US |
dc.type | Conference Object | en_US |
dc.identifier.doi | 10.1109/TIPTEKNO50054.2020.9299262 | - |
dc.identifier.scopus | 2-s2.0-85099443003 | en_US |
dc.authorscopusid | 57206472130 | - |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
dc.identifier.scopusquality | N/A | - |
dc.identifier.wosquality | N/A | - |
item.grantfulltext | reserved | - |
item.openairetype | Conference Object | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.fulltext | With Fulltext | - |
item.languageiso639-1 | en | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | 05.06. Electrical and Electronics Engineering | - |
Appears in Collections: | Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection |
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2727.pdf Restricted Access | 134.17 kB | Adobe PDF | View/Open Request a copy |
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