Browsing by Author "Stanciu S.G."

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    Robustness of Sift Feature Descriptors To Imaging Parameters in Laser Scanning Microscopy
    (Institute of Electrical and Electronics Engineers Inc., 2018) Ünay D.; Stanciu S.G.
    Confocal laser scanning microscopy relies on illuminating the specimen with a focused scanning laser beam and constructing sharp optical sections/images of the investigated specimen by allowing signals from the focal plane only via a pinhole. It is a valuable technique to study fluorescent cells and tissues in-vivo. Its power and potential can be augmented by the use of computer vision methods. However such methods are typically transferred to the microscopy field directly without taking microscopy-specific variations into account. Accordingly in this study we evaluate the robustness of SIFT feature descriptors, a popular computer vision method, against variations in microscopy-specific parameters over a benchmark dataset acquired in a principled manner. Results show that SIFT descriptors are highly robust against variations in laser beam power, whereas their robustness diminishes with larger variations in photomultiplier tube gain. © 2018 IEEE.