Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14365/1302
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dc.contributor.authorKhalaf, Aya-
dc.contributor.authorKersey, Jessica-
dc.contributor.authorEldeeb, Safaa-
dc.contributor.authorAlankus, Gazihan-
dc.contributor.authorGrattan, Emily-
dc.contributor.authorWaterstram, Laura-
dc.contributor.authorSkidmore, Elizabeth-
dc.date.accessioned2023-06-16T14:11:11Z-
dc.date.available2023-06-16T14:11:11Z-
dc.date.issued2018-
dc.identifier.issn0165-0270-
dc.identifier.issn1872-678X-
dc.identifier.urihttps://doi.org/10.1016/j.jneumeth.2018.03.019-
dc.identifier.urihttps://hdl.handle.net/20.500.14365/1302-
dc.description.abstractBackground: Spatial neglect (SN) is a neuropsychological syndrome that impairs automatic attention orienting to stimuli in the contralesional visual space of stroke patients. SN is commonly assessed using paper and pencil tests. Recently, computerized tests have been proposed to provide a dynamic assessment of SN. However, both paper- and computer-based methods have limitations. New method: Electroencephalography (EEG) shows promise for overcoming the limitations of current assessment methods. The aim of this work is to introduce an objective passive BO system that records EEG signals in response to visual stimuli appearing in random locations on a screen with a dynamically changing background. Our preliminary experimental studies focused on validating the system using healthy participants with intact brains rather than employing it initially in more complex environments with patients having cortical lesions. Therefore, we designed a version of the test in which we simulated SN by hiding target stimuli appearing on the left side of the screen so that the subject's attention is shifted to the right side. Results: Results showed that there are statistically significant differences between EEG responses due to right and left side stimuli reflecting different processing and attention levels towards both sides of the screen. The system achieved average accuracy, sensitivity and specificity of 74.24%, 75.17% and 71.36% respectively. Comparison with existing methods: The proposed test can examine both presence and severity of SN, unlike traditional paper and pencil tests and computer-based methods. Conclusions: The proposed test is a promising objective SN evaluation method. Published by Elsevier B.V.en_US
dc.description.sponsorshipNIGMS NIH HHS [P20 GM109040] Funding Source: Medlineen_US
dc.language.isoenen_US
dc.publisherElsevier Science Bven_US
dc.relation.ispartofJournal of Neuroscıence Methodsen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectStrokeen_US
dc.subjectSpatial neglecten_US
dc.subjectAttentionen_US
dc.subjectElectroencephalographyen_US
dc.subjectClassificationen_US
dc.subjectComputer-aided diagnosisen_US
dc.subjectUnilateral Spatial Neglecten_US
dc.subjectHemisphere Strokeen_US
dc.subjectVirtual-Realityen_US
dc.subjectAttentionen_US
dc.subjectBrainen_US
dc.subjectPerformanceen_US
dc.subjectExtinctionen_US
dc.subjectFmrien_US
dc.titleEeg-Based Neglect Assessment: a Feasibility Studyen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.jneumeth.2018.03.019-
dc.identifier.pmid29614297en_US
dc.identifier.scopus2-s2.0-85046695164en_US
dc.departmentİzmir Ekonomi Üniversitesien_US
dc.authoridAlankus, Gazihan/0000-0002-7980-6941-
dc.authorwosidAlankuş, Gazihan/AAE-4840-2022-
dc.authorscopusid56769240800-
dc.authorscopusid57201988255-
dc.authorscopusid55515907100-
dc.authorscopusid23007530500-
dc.authorscopusid54940362100-
dc.authorscopusid54941190200-
dc.authorscopusid8388018400-
dc.identifier.volume303en_US
dc.identifier.startpage169en_US
dc.identifier.endpage177en_US
dc.identifier.wosWOS:000432765800017en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopusqualityQ2-
dc.identifier.wosqualityQ3-
item.grantfulltextopen-
item.fulltextWith Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.languageiso639-1en-
item.openairetypeArticle-
item.cerifentitytypePublications-
crisitem.author.dept05.11. Mechatronics Engineering-
Appears in Collections:PubMed İndeksli Yayınlar Koleksiyonu / PubMed Indexed Publications Collection
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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