Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14365/2010
Title: The mean residual life function of a k-out-of-n structure at the system level
Authors: Asadi, M
Bayramoglu, I
Keywords: characterization
generalized Pareto distributions
increasing failure rate distributions
mean residual lifetime
order statistics
parallel systems
Aging Properties
Order-Statistics
Distributions
Publisher: IEEE-Inst Electrical Electronics Engineers Inc
Abstract: In the study of the reliability of technical systems, k-out-of-n systems play an important role. In the present paper, We consider a k-out-of-n system consisting of n identical components with independent lifetimes having a common distribution function F. Under the condition that, at time t, all the components of the system are working, we propose a new definition for the mean residual life (MRL) function of the system, and obtain several properties of that system.
URI: https://doi.org/10.1109/TR.2006.874934
https://hdl.handle.net/20.500.14365/2010
ISSN: 0018-9529
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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