Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14365/3635
Title: Individual-based Estimation of Valence with EEG
Other Titles: EEG ile Kisi-Temelli Negatif Duygulanim Kestirimi
Authors: Cebeci B.
Akan A.
Demiralp T.
Erbey M.
Keywords: EEG
emotion
film
negative valence
Beamforming
Biomedical engineering
Independent component analysis
Multilayer neural networks
Multilayers
Nearest neighbor search
Cross validation
EEG recording
Emotional valences
Individual-based
K-nearest neighborhoods
Multi-layer perceptron classifiers
Spatial filters
Spectrograms
Classification (of information)
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: In this study, it is determined individual-based features which are used to estimate emotional negative valence and compared the features effectiveness with different classifiers. Ten movie clips are shown to subjects as an emotional stimuli and EEG recording is recorded synchronously. Emotional valence value is scored in [-7 7] Likert scale by the subjects immediately after video ended. According to lowest and highest valence values, two classes are generated. The data is processed on an individual basis and personal spatial filters is obtained by Independent Component Analysis. After calculating the spectrogram of the spatial filtered data, features are extracted by subtracting amplitudes of 3Hz averaged frequency bands. The result of feature selection, it is observed that features from beta and gamma bands are much more effective. The success rate of the selected features was tested with five classifiers by cross validation, and high performance was obtained from multilayer perceptron classifiers and the instance- based k-nearest neighborhood algorithm (IBk-NN). The average accuracies of IBk-NN and multilayer classifier are achieved 86% ±8 and 83% ±9, respectively. © 2020 IEEE.
Description: 2020 Medical Technologies Congress, TIPTEKNO 2020 -- 19 November 2020 through 20 November 2020 -- 166140
URI: https://doi.org/10.1109/TIPTEKNO50054.2020.9299244
https://hdl.handle.net/20.500.14365/3635
ISBN: 9.78173E+12
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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