Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14365/3640
Title: EEG based Epileptic Seizures Detection using Intrinsic Time-Scale Decomposition
Authors: Degirmenci M.
Akan A.
Keywords: EEG
Electroencephalogram
Epileptic Seizures
Intrinsic Time-Scale Decomposition
Biomedical engineering
Brain
Discriminant analysis
Logistic regression
Nearest neighbor search
Neurophysiology
Support vector machines
Support vector regression
Classification performance
Electroencephalogram signals
Epileptic seizure prediction
Feature extraction methods
Intrinsic time-scale decompositions
K nearest neighbor (KNN)
Linear discriminant analysis
Logistic regression classifier
Electroencephalography
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: Epilepsy is a type of neurological disorder that causes abnormal brain activities and creates epileptic seizures. Traditionally epileptic seizure prediction is realized with a visual examination of Electroencephalogram (EEG) signals. But this technique needs a long time EEG monitoring. So, the automatic epileptic seizures prediction schemes become a requirement at this point. This study proposes a method to classify epileptic seizures and normal EEG data by utilizing the Intrinsic Time-scale Decomposition (ITD)-based features. The dataset has been supplied from the database of the Epileptology Department of Bonn University. It contains 5 data groups A, B, C, D, E. The study aims to classify healthy and epileptic data, so data of groups A and E are used to perform evaluations of proposed methods. The EEG data are decomposed into Proper Rotation Components (PRCs) by ITD. The feature extraction methods are applied to the first five PRCs of each EEG data from healthy and epileptic individuals. These features are classified using K-Nearest Neighbors (KNN), Linear Discriminant Analysis (LDA), Naive Bayes, Support Vector Machine (SVM) and Logistic Regression classifiers. The results demonstrated that the epileptic data is differentiated from normal data by applying the nonlinear ITD with outstanding classification performance. © 2020 IEEE.
Description: 2020 Medical Technologies Congress, TIPTEKNO 2020 -- 19 November 2020 through 20 November 2020 -- 166140
URI: https://doi.org/10.1109/TIPTEKNO50054.2020.9299262
https://hdl.handle.net/20.500.14365/3640
ISBN: 9.78173E+12
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection

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