An Analysis on Mutation Testing Tools for C# Programming Language
| dc.contributor.author | Uzunbayır, Serhat | |
| dc.contributor.author | Kurtel, Kaan | |
| dc.date.accessioned | 2023-06-16T15:01:52Z | |
| dc.date.available | 2023-06-16T15:01:52Z | |
| dc.date.issued | 2019 | |
| dc.description | 4th International Conference on Computer Science and Engineering, UBMK 2019 -- 11 September 2019 through 15 September 2019 -- 154916 | en_US |
| dc.description.abstract | Mutation testing is a fault-based white-box software testing technique which uses artificial defects known as mutants to represent faulty versions of the application to evaluate the quality of the test suite. It is a costly method in terms of time and efficiency, since it requires a vast amount of mutants to be generated. For this reason, mutant generation should be performed automatically with the help of automated tools. There are a number of mutation testing tools available and each one is supported by a single programming language. In this study, we analyze mutation testing tools for C#. We focus on different characteristics of the tools and aim to help the testers when deciding which tool they can use for their implementations by providing a comparative analysis. © 2019 IEEE. | en_US |
| dc.identifier.doi | 10.1109/UBMK.2019.8907222 | |
| dc.identifier.isbn | 9.78E+12 | |
| dc.identifier.scopus | 2-s2.0-85076207183 | |
| dc.identifier.uri | https://doi.org/10.1109/UBMK.2019.8907222 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14365/3653 | |
| dc.language.iso | en | en_US |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
| dc.relation.ispartof | UBMK 2019 - Proceedings, 4th International Conference on Computer Science and Engineering | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | C# programming language | en_US |
| dc.subject | mutation operators | en_US |
| dc.subject | mutation testing | en_US |
| dc.subject | software testing | en_US |
| dc.subject | Ada (programming language) | en_US |
| dc.subject | Application programs | en_US |
| dc.subject | Quality control | en_US |
| dc.subject | Testing | en_US |
| dc.subject | Artificial defects | en_US |
| dc.subject | Automated tools | en_US |
| dc.subject | C# programming | en_US |
| dc.subject | Comparative analysis | en_US |
| dc.subject | Fault-based | en_US |
| dc.subject | Mutation operators | en_US |
| dc.subject | Mutation testing | en_US |
| dc.subject | Software testing techniques | en_US |
| dc.subject | Software testing | en_US |
| dc.title | An Analysis on Mutation Testing Tools for C# Programming Language | en_US |
| dc.type | Conference Object | en_US |
| dspace.entity.type | Publication | |
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| gdc.description.departmenttemp | Uzunbayir, S., Department of Software Engineering, Izmir University of Economics, Izmir, Turkey; Kurtel, K., Department of Software Engineering, Izmir University of Economics, Izmir, Turkey | en_US |
| gdc.description.endpage | 443 | en_US |
| gdc.description.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
| gdc.description.scopusquality | N/A | |
| gdc.description.startpage | 439 | en_US |
| gdc.description.wosquality | N/A | |
| gdc.identifier.openalex | W2990712217 | |
| gdc.identifier.wos | WOS:000609879900083 | |
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| gdc.oaire.sciencefields | 0202 electrical engineering, electronic engineering, information engineering | |
| gdc.oaire.sciencefields | 02 engineering and technology | |
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| gdc.virtual.author | Kurtel, Kaan | |
| gdc.virtual.author | Uzunbayır, Serhat | |
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